Precision Farming: A Comprehensive Approach

Authors: Robert "Bobby" Grisso, Extension Engineer, Biological Systems Engineering; Mark Alley, Extension Agronomist & Professor, Crop & Soil Environmental Sciences; Phil McClellan, President, MapTech, Inc., Blacksburg, VA; Dan Brann, Extension Grain Specialist, Crop & Soil Environmental Sciences; and Steve Donohue, Extension Agronomist & Professor, Crop & Soil Environmental Sciences; Virginia Tech

Publication Number: 442-500, posted August 2002

Table 2. Guide to interpreting (or detecting) variability within a yield map (or field). Visual observations from a yield map can be seen as having uniform or irregular patterns (from Lotz, 1997).

Pattern Description/Explanation

Uniform Patterns
With Direction of Application

Against Direction of Application

Irregular Patterns
Irregular Line

Irregular Area/Patch

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