Authors: Robert "Bobby" Grisso, Extension Engineer, Biological Systems Engineering; Mark Alley, Extension Agronomist & Professor, Crop & Soil Environmental Sciences; Phil McClellan, President, MapTech, Inc., Blacksburg, VA; Dan Brann, Extension Grain Specialist, Crop & Soil Environmental Sciences; and Steve Donohue, Extension Agronomist & Professor, Crop & Soil Environmental Sciences; Virginia Tech
Publication Number: 442-500, posted August 2002
Table 2. Guide to interpreting (or detecting) variability within a yield map (or field). Visual observations from a yield map can be seen as having uniform or irregular patterns (from Lotz, 1997).
Pattern Description/Explanation
Uniform Patterns
With Direction of Application
Against Direction of Application
Irregular Patterns
Irregular Line
Irregular Area/Patch